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Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

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The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
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Atomic Emission Spectroscopy: Overview01:20

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Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
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Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle01:19

Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle

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Inductively coupled plasma (ICP) is the most widely used plasma source in atomic emission spectroscopy (AES), also known as Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES). The ICP source, or torch, consists of three concentric quartz tubes with argon gas flowing through them. A spark from a Tesla coil initiates the ionization of argon, generating a high-temperature plasma.
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Atomic Emission Spectroscopy: Lab01:29

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AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
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Atomic Absorption Spectroscopy: Atomization Methods01:25

Atomic Absorption Spectroscopy: Atomization Methods

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Atomic Absorption Spectroscopy (AAS) atomizes samples through flame atomization or electrothermal atomization. Flame atomization typically involves a nebulizer and spray chamber assembly to combine the sample with a fuel–oxidant mixture, creating a fine aerosol mist that enters a burner. Typically, the fuel and oxidant are combined in an approximately stoichiometric ratio. However, for atoms that are easily oxidized, a fuel-rich mixture may be more advantageous. Only about 5% of the...
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Mass Analyzers: Common Types01:19

Mass Analyzers: Common Types

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The quadrupole mass analyzer consists of four cylindrical metal rods arranged in a diamond carrying a DC voltage and a radio-frequency AC voltage. The motion of ions through the quadrupole depends on the field strength, causing only ions of a certain m/z to resonate successfully and strike the detector at a given field strength. Though the transmission rate for these analyzers is high, the exact elemental composition of the sample is not determined because of low resolution; however, they are...
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Hyperpolarized Xenon for NMR and MRI Applications
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Xenon gas field ion source from a single-atom tip.

Wei-Chiao Lai1,2, Chun-Yueh Lin2, Wei-Tse Chang2

  • 1Department of Physics, National Taiwan University, Taipei 10617, Taiwan, Republic of China.

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Researchers developed a new high-brightness Xenon ion beam source using an Iridium/Tungsten single-atom tip. This Gas Field Ion Source (GFIS) offers superior performance for focused ion beam (FIB) systems, even at room temperature.

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Area of Science:

  • Nanoscience and Nanotechnology
  • Materials Science
  • Physics

Background:

  • Focused Ion Beam (FIB) systems are crucial for nanoscale research.
  • Gas Field Ion Sources (GFISs) with atomic-size emitters provide high brightness for improved spatial resolution in FIB.

Purpose of the Study:

  • To demonstrate a high-brightness Xenon (Xe+) ion beam using an Iridium/Tungsten (Ir/W) single-atom tip (SAT).
  • To evaluate the performance and stability of the Xe+ ion beam across a range of temperatures for FIB applications.

Main Methods:

  • Investigated ion emission current and extraction voltage for an Ir/W(111) SAT from 150 K to 309 K.
  • Analyzed reduced brightness at a Xe gas pressure of 1 × 10⁻⁴ torr.
  • Assessed emitter stability at elevated temperatures, including room temperature (RT).

Main Results:

  • Achieved high-brightness Xe+ ion beams with excellent current stability.
  • Demonstrated reduced brightness 2-3 orders of magnitude higher than Ga liquid metal ion sources and 4-5 orders higher than Xe inductively coupled plasma ion sources.
  • The SAT emitter remained stable up to 309 K, with RT currents exceeding 1 pA at higher pressures, indicating feasibility for RT-Xe-GFIS.

Conclusions:

  • The Xe-SAT-GFIS offers significant advantages over existing technologies due to its high brightness and stability at higher operating temperatures.
  • Its operational temperature is higher than the cryogenic requirements for Helium Ion Microscopes (HIM), simplifying implementation.
  • Xe-GFIS-FIB systems are poised to become powerful tools for nanoscale milling and secondary ion mass spectroscopy.