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A graphic approach to the analysis of a large X-ray microanalysis dataset obtained via SEM-EDS

N Yu Parkhimovich1, A R Salikhov2, M F Imayev1,3

  • 1Institute for Metals Superplasticity Problems, Russian Academy of Sciences, Ufa, 450001, Russia.

Microscopy Research and Technique
|May 31, 2017
PubMed

Keywords:
(BiPb)2Sr2Ca2Cu3O10+dX-ray microanalysisadvanced materialsgraphic methodparticle identificationphase composition

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Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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