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The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
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Subsurface Defect Localization by Structured Heating Using Laser Projected Photothermal Thermography.

Erik Thiel1, Mathias Ziegler2

  • 1Department for Non-Destructive Testing, Thermographic Methods, Bundesanstalt für Materialforschung und -prüfung (BAM).

Journal of Visualized Experiments : Jove
|June 2, 2017
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Summary
This summary is machine-generated.

This study introduces a novel reference-free method for locating subsurface defects using destructively interfering thermal waves. The technique precisely identifies defect locations by analyzing thermal radiation oscillations, applicable to various materials.

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Area of Science:

  • Non-destructive testing
  • Thermal wave imaging
  • Materials science

Background:

  • Subsurface defect detection is crucial for material integrity.
  • Existing methods often require references or lack sensitivity.
  • Thermal wave techniques offer potential for non-contact inspection.

Purpose of the Study:

  • To develop a reference-free method for locating subsurface defects.
  • To utilize destructively interfering thermal wave fields for defect detection.
  • To achieve high sensitivity and precise defect localization.

Main Methods:

  • Modification of a projector with a high-power diode laser and spatial light modulator.
  • Optimization of beam shaping for homogeneous projection.
  • High-performance infrared (IR) camera setup with geometric distortion correction.
  • Synchronization of thermal wave sources, scanning stage, and IR camera.
  • Analysis of thermal radiation oscillations from the depletion line for defect identification.

Main Results:

  • Successful generation of destructively interfering thermal wave fields.
  • Detection of weak temperature oscillations indicative of subsurface defects.
  • Precise localization of defects based on spatial-temporal analysis of oscillations.
  • Demonstrated applicability to steel samples, with potential for other materials.

Conclusions:

  • The developed method effectively locates subsurface defects without needing references.
  • The technique is highly sensitive to thermal field disturbances caused by defects.
  • This approach shows promise for inspecting various materials, especially temperature-sensitive ones.