Characterization of Self-Assembled Monolayers on a Ruthenium Surface

A Shaheen1, J M Sturm1, R Ricciardi1

  • 1Industrial focus group XUV Optics, MESA+ Institute for Nanotechnology, and ‡MNF group, MESA+ Institute for Nanotechnology, University of Twente , Enschede, The Netherlands.

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