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Published on: June 8, 2018
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Electro-optic comb based real time ultra-high sensitivity phase noise measurement system for high frequency
1IMRA America Inc., Boulder Research Labs, 1551 South Sunset St, Suite C, Longmont, CO, 80501, USA. nkuse@imra.com.
Scientific Reports
|June 8, 2017
Summary
This study introduces a novel delayed self-heterodyne method for ultra-high sensitivity phase noise characterization. The technique enhances sensitivity using electro-optic comb modes, eliminating the need for time-consuming cross-correlation and high-frequency RF components.
Area of Science:
- Microwave Engineering
- Optical Metrology
- Signal Processing
Background:
- Ultra-low phase noise microwave generation is critical for advanced systems.
- Current phase noise characterization methods are limited by time-consuming averaging and component availability at higher frequencies.
- Cross-correlation techniques can underestimate phase noise due to residual correlations.
Purpose of the Study:
- To develop a new method for ultra-high sensitivity phase noise measurements.
- To overcome limitations of existing characterization systems, particularly for microwaves above 10 GHz.
- To enable direct suppression of radio frequency (RF) oscillator phase noise.
Main Methods:
- A delayed self-heterodyne method is employed.
- Sensitivity is enhanced using higher-order comb modes from an electro-optic comb.
- The system utilizes the bandwidth of electro-optic modulators (up to 100 GHz), obviating the need for specialized high-frequency RF components.
Main Results:
- Achieved ultra-high sensitivity phase noise measurements without cross-correlation.
- Estimated noise floor as low as -171 dBc/Hz at 1 MHz offset frequency for a 10 GHz carrier.
- Demonstrated direct suppression of RF oscillator phase noise up to 100 kHz offset frequency.
Conclusions:
- The proposed method offers a significant advancement in phase noise characterization sensitivity and frequency range.
- Eliminates the need for complex and time-consuming cross-correlation techniques.
- Enables improved performance in microwave generation and related applications.

