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Determining oxygen relaxations at an interface: A comparative study between transmission electron microscopy

N Gauquelin1, K H W van den Bos1, A Béché1

  • 1Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium.

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Summary
This summary is machine-generated.

Aberration corrected transmission electron microscopy (TEM) methods reliably image light elements in nanomaterials. Negative spherical aberration imaging (NCSI) and imaging STEM (ISTEM) offer superior precision, especially in future noise-limited scenarios.

Keywords:
High-resolution (scanning) transmission electron microscopy (HR (S)TEM)Interfaces in perovskite materialsQuantitative electron microscopyStatistical parameter estimation theory

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Area of Science:

  • Materials Science
  • Nanotechnology
  • Microscopy

Background:

  • Aberration corrected transmission electron microscopy (TEM) enables atomic-scale characterization of nanomaterials.
  • Various imaging techniques, including STEM variants and interference contrast methods, visualize light elements.

Purpose of the Study:

  • To quantitatively evaluate and compare the accuracy and precision of different TEM imaging techniques for light element visualization.
  • To assess the robustness of techniques like negative spherical aberration imaging (NCSI) and imaging STEM (ISTEM) for heavy column location extraction.
  • To determine the ultimate precision achievable under future noise-limited conditions.

Main Methods:

  • Quantitative evaluation of NdGaO3-La0.67Sr0.33MnO3 (NGO-LSMO) interface images using statistical parameter estimation theory.
  • Comparison of low angle annular dark field (LAADF) STEM, annular bright field (ABF) STEM, integrated differential phase contrast (iDPC) STEM, NCSI, and ISTEM.
  • Simulation of NGO images considering Poisson noise to predict ultimate precision.

Main Results:

  • All techniques provide reliable results for imaging light elements.
  • NCSI and ISTEM show lower accuracy for heavy column locations compared to other methods.
  • Sample drift and scan distortions limit the precision of STEM-based techniques more than NCSI.
  • Simulations indicate NCSI and ISTEM will offer superior precision in future noise-limited scenarios.

Conclusions:

  • While most techniques reliably image light elements, NCSI and ISTEM excel in precision, particularly under noise-limited conditions.
  • Post-processing can partially mitigate precision limitations in STEM-based techniques.
  • The choice of imaging technique depends on the specific requirements for accuracy and precision in nanomaterial characterization.