Functional NiTi grids for in situ straining in the TEM.

Area of Science:

• Materials Science
• Nanotechnology
• Electron Microscopy

Background:

• In situ measurements significantly enhance conventional transmission electron microscopy (TEM) capabilities.
• Existing commercial holders for in situ straining are often expensive and limited in application.

Purpose of the Study:

• To develop an alternative and cost-effective method for in situ straining experiments in TEM.
• To create versatile Functional Grids for observing material deformation under various strain conditions.

Main Methods:

• Fabrication of Functional Grids using shape memory alloy NiTi thin films.
• Utilizing the martensite-austenite transition temperature for in situ straining observation (50-100°C).
• Performing micro tensile tests and comparing results with finite element simulations.

Main Results:

• Demonstrated the production of NiTi-based Functional Grids suitable for in situ straining.
• Validated the functionality of different grid designs through micro tensile tests and simulations.
• Showcased the technology's application by observing the strain impact on ZnO tetrapod networks.

Conclusions:

• Functional Grids offer a viable and adaptable alternative to expensive commercial holders for in situ TEM straining.
• The NiTi-based grids facilitate the study of deformation mechanisms at accessible temperatures.
• This technology opens new avenues for investigating nanomaterials under mechanical stress.