Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

4.6K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
4.6K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

The recurrent p.Glu3Lys variant in <i>EHHADH</i> is responsible for Fanconi syndrome with early liver dysfunction and mitochondrial abnormalities.

Molecular genetics and metabolism reports·2025
Same author

Understanding caregiver descriptions of initial signs and symptoms to improve diagnosis of metachromatic leukodystrophy.

Orphanet journal of rare diseases·2022
Same author

Cropland trees need to be included for accurate model simulations of land-atmosphere heat fluxes, temperature, boundary layer height, and ozone.

The Science of the total environment·2020
Same author

COVID-19 stay-at-home order in Tyrol, Austria: sports and exercise behaviour in change?

Public health·2020
Same author

Variations of sex development: The first German interdisciplinary consensus paper.

Journal of pediatric urology·2019
Same author

Gonadal function in adult male patients with congenital adrenal hyperplasia.

European journal of endocrinology·2018
Same journal

Ultra-Sensitive UV Photodetectors Enabled by Built-in Electric Fields in Hierarchical NP-Type Porous Silicon.

Nanotechnology·2026
Same journal

Effect of sintering temperature on structural, microstructural and magnetic properties of La<sub>0.8</sub>Sr<sub>0.2</sub>MnO<sub>3</sub>: Evolution of faceting and terrace like morphology.

Nanotechnology·2026
Same journal

Engineered V2C MXene Anchored Cu Nanoparticles for Selective Nitrate/Nitrite Sensing and Magneto-Electrocatalytic Hydrogen Evolution Reaction.

Nanotechnology·2026
Same journal

Quantitative Mechanism Separation of Single-Event Transients in Nanosheet Transistors via TCAD Simulation.

Nanotechnology·2026
Same journal

Antibacterial, mechanical and curing properties of PMMA bone cement loaded with copper nanoparticles.

Nanotechnology·2026
Same journal

Deep learning-enabled self-powered bimodal flexible sensor for intelligent access control.

Nanotechnology·2026
See all related articles

Related Experiment Video

Updated: Feb 27, 2026

Isolation and Biophysical Study of Fruit Cuticles
15:53

Isolation and Biophysical Study of Fruit Cuticles

Published on: March 30, 2012

17.4K

Phase transformation in AFM silicon tips.

M Kopycinska-Müller, M Barth, M Küttner

    Nanotechnology
    |June 27, 2017
    PubMed
    Summary
    This summary is machine-generated.

    Phase transformations in atomic force microscopy silicon tips were observed during nanoindentation of titanium. These changes in silicon tip structure affect mechanical and electrical properties, confirmed by load-unload curves and simulations.

    More Related Videos

    All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
    11:33

    All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

    Published on: January 19, 2018

    10.3K
    Hand Controlled Manipulation of Single Molecules via a Scanning Probe Microscope with a 3D Virtual Reality Interface
    11:00

    Hand Controlled Manipulation of Single Molecules via a Scanning Probe Microscope with a 3D Virtual Reality Interface

    Published on: October 2, 2016

    9.6K

    Related Experiment Videos

    Last Updated: Feb 27, 2026

    Isolation and Biophysical Study of Fruit Cuticles
    15:53

    Isolation and Biophysical Study of Fruit Cuticles

    Published on: March 30, 2012

    17.4K
    All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics
    11:33

    All-electronic Nanosecond-resolved Scanning Tunneling Microscopy: Facilitating the Investigation of Single Dopant Charge Dynamics

    Published on: January 19, 2018

    10.3K
    Hand Controlled Manipulation of Single Molecules via a Scanning Probe Microscope with a 3D Virtual Reality Interface
    11:00

    Hand Controlled Manipulation of Single Molecules via a Scanning Probe Microscope with a 3D Virtual Reality Interface

    Published on: October 2, 2016

    9.6K

    Area of Science:

    • Materials Science
    • Nanotechnology
    • Surface Science

    Background:

    • Atomic Force Microscopy (AFM) is a powerful tool for nanoscale characterization.
    • Understanding tip-sample interactions is crucial for accurate material property measurements.
    • Silicon tips can undergo phase transformations under mechanical stress.

    Purpose of the Study:

    • To investigate phase transformations in AFM silicon tips during nanoindentation of polycrystalline titanium.
    • To analyze the impact of these phase transformations on the tip's mechanical and electrical properties.
    • To correlate experimental observations with atomistic simulations.

    Main Methods:

    • Atomic Force Acoustic Microscopy (AFAM) was employed to measure tip-sample contact stiffness (k*).
    • AFAM system was integrated with a high voltage source/measure unit to monitor effective electrical resistance (Reff).
    • Load-unload curves were analyzed to observe changes in stiffness and resistance.

    Main Results:

    • Phase transformations in the silicon tip, including Si-I to Si-II, were confirmed.
    • Preceding structural changes like distorted diamond structures and Si-III formation were identified.
    • A sudden increase in contact stiffness correlated with a decrease in electrical resistance, indicating metallic Si-II formation.

    Conclusions:

    • Phase transformations in AFM silicon tips significantly influence their mechanical and electrical properties.
    • The study provides insights into the complex structural evolution of silicon under nanoindentation.
    • Experimental findings were validated by molecular dynamics and atomistic simulations.