How roughness affects the depletion mechanism
Related Experiment Video
Updated: Feb 27, 2026

Electrochemical Roughening of Thin-Film Platinum Macro and Microelectrodes
Published on: June 30, 2019
Pietro Anzini1, Alberto Parola
1Dipartimento di Scienza e Alta Tecnologia, Università degli Studi dell'Insubria, Via Valleggio 11, 22100 Como, Italy. alberto.parola@uninsubria.it.
Abstract:
We develop a simple model, in the spirit of the Asakura-Oosawa theory, able to describe the effects of surface roughness on the depletion potential. The resulting explicit expressions are easily computed, without free parameters, for a wide range of physically interesting conditions. Comparison with recent numerical simulations [M. Kamp et al., Langmuir, 2016, 32, 1233] shows an encouraging agreement and allows predicting the onset of colloidal aggregation in dilute suspensions of rough particles. Furthermore, the model proves to be suitable to investigate the role of the geometry of the roughness.
Related Concept Videos
MOSFET: Depletion Mode
The primary characteristic of depletion-mode MOSFETs is their ability to conduct current between the drain and source terminals without gate bias. This inherent conductivity...
Biasing of P-N Junction
In equilibrium, no external voltage is applied across the p-n junction. The depletion region is formed at the junction interface due to the diffusion of carriers, which leaves behind charged dopants, acceptors on the p-side, and donors on the n-side. These immobile charges create an electric field that prevents further diffusion of carriers. The related energy band...
P-N junction
Processes at Electrodes
The Electrical Double Layer
Theories of Dissolution: The Danckwerts' Model and Interfacial Barrier Model

