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Updated: Feb 27, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
Data on TOF-SIMS analysis of Cu2+, Co2+ and Cr3+ doped calcium phosphate cements
Anja Henß1, Martha Schamel2, Uwe Gbureck2
1Institute of Physical Chemistry, Justus Liebig University of Giessen, Heinrich-Buff-Ring 17, 35392 Giessen, Germany.
Abstract:
This article contains data of time of flight secondary ion mass spectrometry (TOF-SIMS) analysis of brushite-forming calcium phosphate cements doped with biologically active metal ions. This data are related to the research article "Cu2+, Co2+ and Cr3+ doping of a calcium phosphate cement influences materials properties and response of human mesenchymal stromal cells" (Schamel et al., 2017) [1]. Cu2+, Co2+ and Cr3+ doped β-tricalcium phosphate precursor powders were used to prepare cement samples. The incorporation and distribution of the metal ions in the cement matrix was visualized by imaging mass spectrometry.
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