Atomic Force Microscopy
Overview of Microscopy Techniques
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Updated: Feb 27, 2026

Surface Potential Measurement of Bacteria Using Kelvin Probe Force Microscopy
Published on: November 28, 2014
Jie Xu1,2, Yangqing Wu2, Wei Li1,2
1Nanjing University of Posts and Telecommunications, Nanjing 210023, People's Republic of China.
Kelvin probe force microscopy (KPFM) surface potential modeling was advanced using a precise electrodynamic approach. This improved modeling accurately reconstructs surface potential, crucial for quantitative nanoscale analysis in electronic devices.
12:18Co-localizing Kelvin Probe Force Microscopy with Other Microscopies and Spectroscopies: Selected Applications in Corrosion Characterization of Alloys
Published on: June 27, 2022
06:37Protrusion Force Microscopy: A Method to Quantify Forces Developed by Cell Protrusions
Published on: June 16, 2018
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