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Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
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The early pioneers of microscopy opened a window into the invisible world of microorganisms. In 1830, Joseph Jackson Lister created an essentially modern light microscope. The 20th century saw the development of microscopes that leveraged nonvisible light, such as fluorescence microscopy that uses an ultraviolet light source and electron microscopy that uses short-wavelength electron beams. These advances significantly improved magnification, image resolution, and contrast. By comparison, the...
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Related Experiment Video

Updated: Feb 27, 2026

Hand Controlled Manipulation of Single Molecules via a Scanning Probe Microscope with a 3D Virtual Reality Interface
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Two-probe atomic-force microscope manipulator and its applications.

A A Zhukov1, V S Stolyarov1, O V Kononenko2

  • 1Institute of Solid State Physics, Russian Academy of Science, Chernogolovka 142432, Russia.

The Review of Scientific Instruments
|July 3, 2017
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Summary
This summary is machine-generated.

This study introduces a novel two-probe atomic force microscope (AFM) manipulator for precise nanowire manipulation. The system utilizes individual feedback for each probe, enabling delicate handling under an optical microscope.

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Area of Science:

  • Nanotechnology
  • Materials Science
  • Microscopy

Background:

  • Atomic Force Microscopy (AFM) is a powerful tool for nanoscale imaging and manipulation.
  • Precise manipulation of nanostructures like nanowires is crucial for developing advanced electronic and optical devices.
  • Existing manipulation techniques often lack the dexterity and precision required for complex nanoscale assembly.

Purpose of the Study:

  • To develop and demonstrate a novel two-probe AFM manipulator for precise nanowire handling.
  • To integrate the manipulator with an upright optical microscope for enhanced visualization during manipulation.
  • To showcase the advantages of a two-probe design with individual feedback systems for nanoscale manipulation tasks.

Main Methods:

  • A custom manipulator was designed based on a two-probe atomic force microscope (AFM).
  • An individual feedback system was implemented for each AFM probe.
  • The manipulator was integrated with an upright optical microscope featuring a 3 mm focal distance.
  • Nanowire manipulation was performed using the AFM probes configured as a two-prong fork.
  • AFM feedback was achieved using dynamic full-time contact mode.

Main Results:

  • The developed two-probe AFM manipulator successfully enabled precise manipulation of nanowires.
  • The individual feedback system for each probe allowed for controlled and stable manipulation.
  • Integration with the optical microscope provided real-time visualization of the manipulation process.
  • The two-prong fork configuration proved effective for grasping and positioning nanowires.
  • Demonstrated the feasibility and advantages of the proposed manipulation technique.

Conclusions:

  • The two-probe AFM manipulator offers a robust and precise platform for nanowire manipulation.
  • The individual probe feedback system enhances control and stability in nanoscale operations.
  • This technology holds significant potential for applications in nanoelectronics, nanophotonics, and nanoscale assembly.
  • The design facilitates intricate manipulation tasks previously challenging with single-probe systems.