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Published on: October 2, 2016
Two-probe atomic-force microscope manipulator and its applications
A A Zhukov1, V S Stolyarov1, O V Kononenko2
1Institute of Solid State Physics, Russian Academy of Science, Chernogolovka 142432, Russia.
Abstract:
We report on a manipulator based on a two-probe atomic force microscope (AFM) with an individual feedback system for each probe. This manipulator works under an upright optical microscope with 3 mm focal distance. The design of the microscope helps us tomanipulate nanowires using the microscope probes as a two-prong fork. The AFM feedback is realized based on the dynamic full-time contact mode. The applications of the manipulator and advantages of its two-probe design are presented.
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