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Construction and Characterization of External Cavity Diode Lasers for Atomic Physics
Published on: April 24, 2014
28.7K
1.5 μm Lasers with Sub-10 mHz Linewidth
D G Matei1, T Legero1, S Häfner1
1Physikalisch-Technische Bundesanstalt, Bundesallee 100, 38116 Braunschweig, Germany.
Physical Review Letters
|July 15, 2017
Summary
Two ultrastable lasers stabilized to silicon cavities achieved a fractional frequency instability of 4×10⁻¹⁷, limited by thermal Brownian noise. This research provides methods to connect noise to practical laser linewidths and coherence times.
Area of Science:
- Quantum optics
- Laser physics
- Metrology
Background:
- High-stability lasers are crucial for precision measurements.
- Thermal Brownian noise in optical cavities limits laser frequency stability.
- Understanding and mitigating noise sources is essential for advancing metrology.
Purpose of the Study:
- To report on two ultrastable lasers stabilized to independent silicon Fabry-Pérot cavities.
- To investigate the fundamental limits imposed by thermal Brownian noise on laser frequency instability.
- To develop methods for relating flicker frequency noise to observable linewidths and coherence times.
Main Methods:
- Stabilization of two independent lasers to silicon Fabry-Pérot cavities at 124 K.
- Characterization of fractional frequency instability and identification of noise sources.
- Analysis of phase noise spectra and beat notes between lasers.
- Derivation of methods to quantify noise-induced divergences.
Main Results:
- Achieved fractional frequency instability floor of 4×10⁻¹⁷, limited by thermal Brownian noise.
- Demonstrated laser linewidths as narrow as 5 mHz at 194 THz.
- Derived usable phase coherence times ranging from 11 to 55 s.
Conclusions:
- Thermal Brownian noise in mirror coatings is the dominant factor limiting laser instability.
- The developed methods provide practical links between noise phenomena and observable laser parameters.
- The achieved performance represents a significant advancement in ultrastable laser technology for metrology and fundamental science.

