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Updated: Feb 25, 2026

Atomically Traceable Nanostructure Fabrication
Published on: July 17, 2015
Universal Nanopatterning Technique Combining Secondary Sputtering with Nanoscale Electroplating for Fabricating
Tae-Eun Song1,2, Chi Won Ahn1, Hwan-Jin Jeon3,4
1Department of Nano-Structured Materials Research, National NanoFab Center (NNFC) , 291 Daehak-ro, Yuseong-gu, Daejeon 34141, Republic of Korea.
Abstract:
Here, we describe a next-generation lithographic technique for fabricating ultrahigh-resolution nanostructures. This technique makes use of the secondary sputtering phenomenon of plasma ion etching and of nanoscale electroplating to finely control the resolution of the fabricated structures from ten nanometers to hundreds of nanometers from a single microsized master pattern. In contrast to previously described techniques that incorporate a recently developed secondary sputtering lithography (SSL) patterning approach, which could only yield 10 nm-resolution structures, in the current technique, we used an improved SSL approach to produce various-sized, high-resolution structures. Additionally, this improved SSL approach was used to fabricate size-controllable 3D patterns on various types of substrates, in particular, a silicon wafer, transparent glass, and flexible polycarbonate (PC) film. Thus, this method can serve as a new-concept patterning method for the efficient mass production of ultrahigh-resolution nanostructures.

