Quantifying non-contact tip-sample thermal exchange parameters for accurate scanning thermal microscopy with heated

Adam A Wilson1, Theodorian Borca-Tasciuc1

  • 1Department of Mechanical, Aerospace and Nuclear Engineering, Rensselaer Polytechnic Institute, 110 8th St., Troy, New York 12180, USA.

Summary

Accurate non-contact thermal conductivity measurements using scanning thermal microscopy require careful calibration. This study shows that thermal exchange parameters depend on sample properties, influencing results, and suggests optimal calibration sample sets for improved accuracy.

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