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Updated: Feb 25, 2026

Nanofabrication of Gate-defined GaAs/AlGaAs Lateral Quantum Dots
Published on: November 1, 2013
D González1, V Braza1, A D Utrilla2
1University Research Institute on Electron Microscopy & Materials, (IMEYMAT) Universidad de Cádiz, E-11510 Puerto Real (Cádiz), Spain.
A new method quantifies indium arsenide (InAs) in wetting layers (WL) and quantum dots (QDs). Capping layer growth rates influence InAs distribution and QD properties, impacting optical characteristics.
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