Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

4.6K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
4.6K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Real-World Effectiveness and Safety of Tildrakizumab in a Large Spanish Multicenter Cohort from Spanish Psoriasis Group (GPS).

Pharmacy (Basel, Switzerland)·2026
Same author

Extreme confinement unleashes water's hidden electrical capabilities.

Nature·2025
Same author

Aortic Dissection With Cardiac Tamponade in Pregnancy: A Challenging Clinical Scenario.

Cureus·2023
Same author

No tuberculosis reactivations in psoriasis patients initiating new generation biologics despite untreated latent tuberculosis infection: Multicenter case series of 35 patients.

Journal of the European Academy of Dermatology and Venereology : JEADV·2023
Same author

Quantification of van der Waals forces in bimodal and trimodal AFM.

The Journal of chemical physics·2023
Same author

Development and application of a composite circularity index.

Journal of environmental management·2023

Related Experiment Video

Updated: Feb 25, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

17.5K

Imaging Water Thin Films in Ambient Conditions Using Atomic Force Microscopy.

Sergio Santos1, Albert Verdaguer2

  • 1Laboratory for Energy and NanoScience (LENS), Institute Center for Future Energy (iFES), Masdar Institute of Science and Technology, Abu Dhabi 54224, UAE. ssantos78h@gmail.com.

Materials (Basel, Switzerland)
|August 5, 2017
PubMed
Summary

Atomic Force Microscopy (AFM) can image nanoscale water films on surfaces. This review explores AFM methods to overcome probe-induced liquid perturbations for detailed surface water analysis.

Keywords:
adsorptionatomic force microscopythin filmswater

More Related Videos

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers
10:15

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers

Published on: July 22, 2015

15.5K
Investigating Single Molecule Adhesion by Atomic Force Spectroscopy
09:48

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Published on: February 27, 2015

10.9K

Related Experiment Videos

Last Updated: Feb 25, 2026

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid
10:25

Sub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid

Published on: December 20, 2016

17.5K
Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers
10:15

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers

Published on: July 22, 2015

15.5K
Investigating Single Molecule Adhesion by Atomic Force Spectroscopy
09:48

Investigating Single Molecule Adhesion by Atomic Force Spectroscopy

Published on: February 27, 2015

10.9K

Area of Science:

  • Surface Science
  • Nanotechnology
  • Physical Chemistry

Background:

  • Ambient surfaces are covered by nanoscale water films affecting substrate properties.
  • Photon-based spectroscopy lacks lateral resolution for these films.
  • Heterogeneous water affinity at the nanoscale requires high-resolution 3D imaging.

Purpose of the Study:

  • To review Atomic Force Microscopy (AFM) methods for analyzing nanoscale water films.
  • To address challenges in AFM measurements due to probe-liquid interactions.
  • To discuss the information obtainable about water films using various AFM interactions.

Main Methods:

  • Utilizing Atomic Force Microscopy (AFM) for high-resolution 3D imaging in ambient conditions.
  • Developing and reviewing AFM techniques to minimize probe perturbations on water films.
  • Measuring diverse interactions between the AFM probe and surface water films.

Main Results:

  • AFM provides nanometer resolution for studying surface water films.
  • Specific AFM methods can control or avoid probe-induced perturbations.
  • Different AFM interactions yield varied information on water film structure and properties.

Conclusions:

  • AFM is a powerful tool for characterizing nanoscale water films on heterogeneous surfaces.
  • Overcoming probe-liquid interactions is crucial for accurate AFM analysis of water films.
  • This review provides a comprehensive overview of AFM-based approaches for water film investigation.