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Updated: Feb 25, 2026

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens
Published on: June 2, 2017
Three-Dimensional Imaging of Dislocations in a Ti-35mass%Nb Alloy by Electron Tomography
Kazuhisa Sato1, Satoshi Semboshi2, Toyohiko J Konno3
1Institute for Materials Research, Tohoku University, 2-1-1 Katahira, Aoba-ku, Sendai 980-8577, Japan. ksato@imr.tohoku.ac.jp.
Abstract:
We have studied three-dimensional (3D) configurations of dislocations in the β phase of a Ti-35mass%Nb alloy by means of single-axis tilt tomography using bright-field scanning transmission electron microscopy (BF-STEM). To visualize dislocations, the hh0 systematic reflections were excited throughout tilt-series acquisition with the maximum tilt angle of 70°. Dislocations in the β grains were clearly reconstructed by the weighted back-projection algorithm. The slip planes of the dislocations were deduced by rotating the reconstructed volumes with the aid of selected area electron diffraction patterns. It was found that BF-STEM images with relatively low contrasts, taken along low-order zone axes, are capable to reproduce and preserve the quality of reconstructed image of dislocations. We also found that tilt angles as low as 40° are practically acceptable to visualize 3D configurations of dislocations, while there exists limitation in resolution due to the existence of a large missing wedge.
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