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Holographic fabrication of an arrayed one-axis scale grating for a two-probe optical linear encoder
Optics Express
|August 10, 2017
Summary
We developed a new method for fabricating large-scale gratings for optical encoders using interference lithography (IL). This cost-effective technique simplifies precision measurement applications.
Area of Science:
- Optics and Photonics
- Metrology and Measurement Science
- Materials Science and Engineering
Background:
- Precision measurement systems often rely on optical encoders for accurate linear displacement sensing.
- Traditional fabrication of large-scale gratings can be complex and costly, limiting their widespread application.
- Existing methods may require stringent control over grating parameters, increasing manufacturing challenges.
Purpose of the Study:
- To present a novel method for fabricating arrayed one-axis scale gratings for two-probe optical linear encoders.
- To demonstrate the utility of a dual-beam interference lithography (IL) system with a compact diode laser source.
- To enable the creation of large-width gratings with small line spacing through a simplified and robust process.
Main Methods:
- Utilizing a dual-beam interference lithography (IL) system.
- Employing a multiple-exposure stitching technique to form arrayed scale gratings.
- Integrating the fabricated gratings with a newly developed two-probe optical encoder.
Main Results:
- Successfully fabricated arrayed scale gratings with small line spacing over a large width.
- Demonstrated seamless numerical connection of measurement results from the two-probe encoder.
- Validated a simplified and robust fabrication process by eliminating the need for gap width and grating phase control.
- Confirmed the feasibility of the technology through experimental validation.
Conclusions:
- The proposed interference lithography (IL) based multiple-exposure stitching method offers a flexible and cost-effective approach for fabricating large-scale gratings.
- This technique simplifies the manufacturing process for optical encoders, enhancing their practicality in precision measurement.
- The developed method holds significant potential for advancing various precision measurement applications.

