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Related Concept Videos

Tandem Mass Spectrometry01:21

Tandem Mass Spectrometry

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Tandem mass spectrometry is a technique that uses multiple mass analyzers in series to obtain a higher selectivity and reduce chemical noise during analyte detection. Instruments with multiple analyzers separated by an interaction cell enable secondary fragmentation and selected study of the fragment ions.Secondary fragmentations occur in the interaction cell and can be induced by various factors. Fragmentation induced by collision with inert gases, such as N2, Ar, He, etc., is called...
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Mass Spectrum: Interpretation01:24

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An unknown compound can be established by identifying the molecular ion peak in the mass spectrum. The molecular ion peak is often weak or absent due to the predominance of fragmentation in high-energy electron beams. In such cases, a soft-energy electron beam can be used to scan the spectrum to enhance the intensity of the molecular ion peak. Additionally, chemical ionization, field ionization, and desorption ionization spectra are used to obtain a relatively intense molecular ion peak.To...
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Mass Spectrometers

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This lesson details the instrumentation of a mass spectrometer—a physical instrument to perform mass spectrometry on analyte molecules and record the characteristic mass spectra. This is achieved via three chief functions:
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MALDI-TOF Mass Spectrometry01:19

MALDI-TOF Mass Spectrometry

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Mass spectrometry is a powerful characterization technique that can identify and separate a wide variety of compounds ranging from chemical to biological entities, based on their mass-to-charge ratio (m/z). The instruments that allow this detection, known as mass spectrometers, have three components: an ion source, a mass analyzer, and a detector. These spectrometers differ based on the nature of their ion source and analyzers.Matrix-assisted laser desorption ionization (MALDI) is a commonly...
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Peptide Identification Using Tandem Mass Spectrometry01:33

Peptide Identification Using Tandem Mass Spectrometry

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Tandem mass spectrometry, also known as MS/MS or MS2, is an analytical technique that employs two mass analyzers. Essentially it is a series of mass spectrometers that helps isolate a particular biomolecule and then helps study its chemical properties.
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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Related Experiment Video

Updated: Feb 24, 2026

Close-Space Sublimation-Deposited Ultra-Thin CdSeTe/CdTe Solar Cells for Enhanced Short-Circuit Current Density and Photoluminescence
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APT mass spectrometry and SEM data for CdTe solar cells.

Jonathan D Poplawsky1, Chen Li2, Naba R Paudel3

  • 1Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA.

Data in Brief
|August 11, 2017
PubMed
Summary

Atom probe tomography reveals critical details of the Cadmium Sulfide/Cadmium Telluride (CdS/CdTe) solar cell interface. This analysis provides insights into material composition and grain boundaries in treated and untreated CdTe solar cells.

Keywords:
Atom probe tomographyMass spectroscopyScanning electron microscopySolar cells

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Area of Science:

  • Materials Science
  • Solid State Physics
  • Renewable Energy

Background:

  • CdTe solar cells are a promising photovoltaic technology.
  • Understanding the CdS/CdTe interface is crucial for improving device efficiency.
  • The effect of CdCl2 treatment on CdTe solar cells is not fully understood at the atomic level.

Purpose of the Study:

  • To present Atom Probe Tomography (APT) data of the CdS/CdTe interface in non-CdCl2 treated CdTe solar cells.
  • To analyze the mass spectrum of APT data including a grain boundary (GB) in a CdCl2-treated CdTe solar cell.
  • To showcase Scanning Electron Microscopy (SEM) and Scanning Transmission Electron Microscopy (STEM) Electron Beam Induced Current (EBIC) data for sample preparation and analysis.

Main Methods:

  • Atom Probe Tomography (APT) using a CAMECA LEAP 4000 XHR.
  • Scanning Electron Microscopy (SEM) for sample preparation.
  • Scanning Transmission Electron Microscopy (STEM) with Electron Beam Induced Current (EBIC).

Main Results:

  • APT data provided insights into the CdS/CdTe interface of untreated CdTe solar cells.
  • Mass spectrometry peak decomposition of Cu and Te was observed within an APT dataset.
  • The study detailed the preparation of APT needles and cross-sectional STEM EBIC samples from CdTe solar cells.

Conclusions:

  • APT is a powerful technique for characterizing the atomic-scale composition of CdTe solar cells.
  • Understanding interface and grain boundary structures is key to optimizing CdTe solar cell performance.
  • The presented data contribute to the fundamental knowledge of CdTe solar cell materials and processing.