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Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
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200 keV cold field emission source using carbon cone nanotip: Application to scanning transmission electron

Shuichi Mamishin1, Yudai Kubo1, Robin Cours2

  • 1Hitachi High-Technologies Corporation, 882, Ichige, Hitachinaka, Ibaraki 312-8504, Japan.

Ultramicroscopy
|August 15, 2017
PubMed

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