Characterization of polycrystalline lead oxide for application in direct conversion X-ray detectors
O Semeniuk1,2, O Grynko3,4, G Decrescenzo5
1Chemistry and materials science program, Lakehead University, 955 Oliver Road, Thunder Bay, ON, P7B 5E1, Canada. osemeniu@lakeheadu.ca.
Scientific Reports
|August 19, 2017
Summary
Polycrystalline lead oxide (poly-PbO) shows promise for X-ray detectors. This study quantifies its charge yield and mobility-lifetime product, revealing key insights for improving detector technology.
Area of Science:
- Materials Science
- Solid-State Physics
- Detector Technology
Background:
- Polycrystalline lead oxide (poly-PbO) is a promising photoconductor for X-ray detection.
- Key performance parameters like charge yield and mobility-lifetime product (μτ) require further investigation.
Purpose of the Study:
- To investigate X-ray photogeneration and recombination processes in poly-PbO.
- To determine the energy required for electron-hole pair generation (W±) and the mobility-lifetime product (μτ).
Main Methods:
- Utilized X-ray induced photocurrent and pulse height spectroscopy.
- Applied the Hecht formula to analyze pulse height spectra.
Main Results:
- Energy required to release an electron-hole pair (W±) depends on the electric field, reaching ~20 eV/ehp at 10 V/μm.
- Mobility-lifetime products (μτ) for holes and electrons were determined to be 4.1 × 10⁻⁸ cm²/V and 10⁻⁹ cm²/V, respectively.
- Results suggest potential for improved PbO X-ray detector architectures.
Conclusions:
- Established W± and μτ values for poly-PbO under X-ray irradiation.
- Findings provide a basis for enhancing poly-PbO based X-ray detector performance.
- Proposed integration of Frisch grids or X-ray transistor architectures for technological advancement.


