X-ray Crystallography
Phase Contrast and Differential Interference Contrast Microscopy
Imaging Biological Samples with Optical Microscopy
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Updated: Feb 23, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
Published on: May 28, 2016
A Ulvestad1, Y Nashed2, G Beutier3
1Materials Science Division, Argonne National Laboratory, Argonne, Illinois, 60439, USA. aulvestad@anl.gov.
Imaging crystallographic defects in materials is challenging. This study explores guided phase retrieval algorithms for Bragg coherent diffractive imaging (BCDI) to accurately reconstruct defect networks in crystals.
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Published on: October 11, 2016
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