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X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
Published on: August 20, 2019
S Butera1, G Lioliou2, A B Krysa3
1Semiconductor Materials and Devices Laboratory, School of Engineering and Informatics, University of Sussex, Brighton, BN1 9QT, UK. S.Butera@sussex.ac.uk.
This study introduces the first Indium Gallium Phosphide (InGaP) photon-counting X-ray photodiode, demonstrating its effectiveness for X-ray spectroscopy. The developed InGaP devices achieve excellent energy resolution, paving the way for advanced X-ray detection applications.
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