The EIGER detector for low-energy electron microscopy and photoemission electron microscopy

Area of Science:

• Materials Science
• Physics
• Instrumentation

Background:

• EIGER is a hybrid pixel detector for synchrotron applications above 5 keV.
• It features small pixels, high frame rates, low dead-time, and a 32-bit dynamic range.

Purpose of the Study:

• To report the use of the EIGER detector for electron detection in Low-Energy Electron Microscopy (LEEM) and Photoemission Electron Microscopy (PEEM).
• To demonstrate EIGER's capability in detecting electrons accelerated to 8-20 keV with minimal modification.

Main Methods:

• Minimal modification of the EIGER detector's sensitive part for electron detection.
• Benchmarking detector performance using LEEM experiments.
• Characterizing magnetic and electronic properties of iron nanoparticles using PEEM.

Main Results:

• EIGER successfully detects electrons in LEEM and PEEM with energies of 8-20 keV.
• Imaging capabilities surpass standard microchannel plate detectors due to higher signal-to-noise, homogeneity, and dynamic range.
• EIGER shows no radiation damage from electrons and offers stable, long-term performance.

Conclusions:

• The modified EIGER detector is a superior alternative to traditional detectors for LEEM and PEEM applications.
• It enables advanced nanoscale characterization of material properties, as demonstrated with iron nanoparticles.