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Updated: Feb 23, 2026

Scanning SQUID Study of Vortex Manipulation by Local Contact
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Scanning SQUID sampler with 40-ps time resolution.

Zheng Cui1, John R Kirtley2, Yihua Wang3

  • 1Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, California 94025, USA.

The Review of Scientific Instruments
|September 3, 2017
PubMed
Summary
This summary is machine-generated.

This study introduces a novel scanning Superconducting QUantum Interference Device (SQUID) sampler. It achieves 40-picosecond time resolution for imaging magnetic material dynamics.

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Area of Science:

  • Condensed Matter Physics
  • Materials Science
  • Nanotechnology

Background:

  • Scanning SQUID microscopy is crucial for characterizing magnetic properties of materials and devices.
  • Traditional flux-locked loops in SQUIDs limit response times to microseconds or longer, hindering dynamic studies.

Purpose of the Study:

  • To design, fabricate, and characterize a novel scanning SQUID sampler.
  • To achieve significantly improved time resolution (40 ps) for dynamic magnetic imaging.
  • To enable linearized response for periodically triggered signals.

Main Methods:

  • Development of a SQUID sampler with a micron-scale pickup loop and integrated field and modulation coils.
  • Fabrication of the sampler device on a 2 mm × 2 mm chip for scanning macroscopic planar samples.
  • Operation in a flux-locked loop to linearize the flux response.

Main Results:

  • Demonstration of a scanning SQUID sampler with 40-picosecond time resolution.
  • Achieved flux noise of approximately 1 mΦ₀ at 4.2 K with 100 kHz repetition rate and 1s averaging.
  • Successful integration of features for local magnetic field application and linearized flux response.

Conclusions:

  • The developed SQUID sampler offers unprecedented temporal resolution for magnetic imaging.
  • This technology is poised to advance the study of dynamic processes in magnetic and superconducting materials.
  • The compact, scannable design facilitates versatile applications in materials characterization.