The offset droplet: a new methodology for studying the solid/water interface using x-ray photoelectron spectroscopy

Area of Science:

• Surface Science
• Materials Chemistry
• Spectroscopy

Background:

• Studying the solid-water interface is crucial for understanding various chemical and physical processes.
• Existing techniques for solid-water interface analysis using X-ray Photoelectron Spectroscopy (XPS) have limitations in sample flexibility.

Purpose of the Study:

• To develop a novel and flexible approach for routine study of the solid-water interface using XPS.
• To overcome the limitations of current techniques for analyzing solid-liquid interfaces.

Main Methods:

• Introduction of a thin capillary for injecting small liquid droplets onto the sample surface in Near Ambient Pressure XPS (NAP-XPS).
• Precise control over droplet size to establish a water layer of controllable thickness.
• Analysis of the solid-water interface on a vacuum-prepared TiO2(110) single crystal.

Main Results:

• Demonstration of a novel and flexible method for analyzing solid-water interfaces.
• Successful establishment of a controllable water layer at the interface.
• Validation of the technique by addressing the solid/liquid interface on TiO2(110).

Conclusions:

• The developed NAP-XPS technique offers a revolutionary and flexible approach to studying solid-water interfaces.
• This method opens up new research possibilities in photoelectron spectroscopy.
• The solid-water interface is addressable using this advanced technique.