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Updated: Feb 23, 2026

Sample Preparation and Experimental Design for In Situ Multi-Beam Transmission Electron Microscopy Irradiation Experiments
Published on: June 27, 2022
Probing microwave fields and enabling in-situ experiments in a transmission electron microscope
F J T Goncalves1,2, G W Paterson3, D McGrouther3
1Department of Physics and Electronics, Osaka Prefecture University, Osaka, 599-8570, Japan. f-goncalves@pe.osakafu-u.ac.jp.
Abstract:
A technique is presented whereby the performance of a microwave device is evaluated by mapping local field distributions using Lorentz transmission electron microscopy (L-TEM). We demonstrate the method by measuring the polarisation state of the electromagnetic fields produced by a microstrip waveguide as a function of its gigahertz operating frequency. The forward and backward propagating electromagnetic fields produced by the waveguide, in a specimen-free experiment, exert Lorentz forces on the propagating electron beam. Importantly, in addition to the mapping of dynamic fields, this novel method allows detection of effects of microwave fields on specimens, such as observing ferromagnetic materials at resonance.
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