Detection of CuAuPd Phase Boundaries Using Core Level Shifts
Chunrong Yin1, James B Miller1, Petro Kondratyuk1
1Department of Chemical Engineering and ‡W.E. Scott Institute for Energy Innovation, Carnegie Mellon University , Pittsburgh, Pennsylvania 15213, United States.
The Journal of Physical Chemistry. B
|September 16, 2017
Summary
This study used X-ray photoemission spectroscopy (XPS) to analyze copper-gold-palladium alloys. Core level shifts revealed phase transitions, enabling mapping of the B2 phase in ternary alloys.
Area of Science:
- Materials Science
- Surface Science
- Solid State Chemistry
Background:
- Ternary alloys like Cu-Au-Pd are crucial in various applications.
- Understanding phase behavior in alloys is essential for material design.
- X-ray Photoemission Spectroscopy (XPS) is a powerful surface-sensitive technique.
Purpose of the Study:
- To investigate the electronic structure of Cu-Au-Pd alloys using XPS.
- To correlate core level binding energy shifts with alloy composition and phase.
- To develop XPS as a method for phase mapping in complex alloys.
Main Methods:
- High-throughput synthesis of a continuous composition spread alloy film (CSAF) of CuxAuyPd1-x-y.
- Acquisition and analysis of X-ray photoemission spectra for Cu 2p3/2, Au 4f7/2, and Pd 3d3/2 core levels.
- Correlation of core level shifts with crystallographic phases (FCC and B2).
Main Results:
- All constituent elements (Cu, Au, Pd) showed core level binding energy shifts in the alloy compared to pure elements.
- The Cu 2p3/2 core level shift exhibited discontinuities corresponding to FCC-B2 phase transitions.
- The B2 phase extent was successfully mapped across the ternary CuxAuyPd1-x-y composition space.
Conclusions:
- Core level binding energy shifts are sensitive indicators of phase transitions in alloys.
- XPS can be effectively used to map alloy phases, particularly in the B2 phase of Cu-Au-Pd.
- This XPS-based phase mapping approach is applicable to various material morphologies, including nanoparticles and thin films, where diffraction methods are limited.
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