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A Psychophysics Paradigm for the Collection and Analysis of Similarity Judgments
Published on: March 1, 2022
Yanhong Bi1,2, Bin Fan1, Fuchao Wu1
1National Laboratory of Pattern Recognition, Institute of Automation, Chinese Academy of Sciences, Beijing, P.R.China.
We introduce the multiple Cayley-Klein metric, a novel approach extending the Cayley-Klein metric for complex data distributions. This method enhances metric learning performance by combining multiple non-linear metrics for better data modeling.
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