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Automatic system for electron tomography data collection in the ultra-high voltage electron microscope

Meng Cao1, Ryuji Nishi2, Fang Wang3

  • 1Key Laboratory for Physical Electronics and Devices of the Ministry of Education, Department of Electronic Science and Technology, Xi'an Jiaotong University, Xi'an 710049, PR China; Research Centre for Ultra-High Voltage Electron Microscopy, Osaka University, 7-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan.

Micron (Oxford, England : 1993)
|September 26, 2017
PubMed

Keywords:
Auto focusAuto trackingData collectionElectron tomographyImage stitching

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