Chunyan Jiang1, Ting Liu1, Chunhua Du1
1Beijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences; National Center for Nanoscience and Technology (NCNST), Beijing 100083, People's Republic of China.
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
This study demonstrates that applying stress to AlGaN/GaN high electron mobility transistors (HEMTs) enhances carrier transport and device performance. The piezotronic effect, using strain-induced charges, boosts current by up to 21%.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: