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Single-shot dual-wavelength off-axis quasi-common-path digital holography using polarization-multiplexing
Optics Express
|October 19, 2017
Summary
This study introduces a novel dual-wavelength digital holography technique for precise quantitative phase imaging. The method uses polarization-multiplexing for single-shot, high-resolution phase and height measurements of specimens.
Area of Science:
- Optical Imaging
- Metrology
- Holography
Background:
- Quantitative phase imaging (QPI) is crucial for label-free microscopy.
- Traditional QPI methods often require complex setups or multiple measurements.
- Developing single-shot, high-resolution QPI techniques remains a challenge.
Purpose of the Study:
- To develop a dual-wavelength off-axis digital holography system for single-shot QPI.
- To utilize polarization-multiplexing to separate wavelengths and enable simultaneous phase measurement.
- To validate the system's performance using standard calibration targets.
Main Methods:
- A dual-wavelength off-axis quasi-common-path digital holography setup was designed.
- Polarization-multiplexing with a polarizing beam splitter and retro-reflector mirrors was employed.
- A division algorithm was used for reconstructing phase and height information from a single multiplexed interferogram.
Main Results:
- The system successfully separated dual-wavelength information in a single shot.
- Quantitative phase and height maps were reconstructed with high accuracy.
- Experimental validation on square and circular step targets demonstrated the setup's validity and stability.
Conclusions:
- The proposed dual-wavelength digital holography technique offers a robust and stable method for single-shot QPI.
- The polarization-multiplexing approach simplifies the experimental setup and enhances measurement efficiency.
- This technique holds potential for various applications requiring precise, non-invasive metrology.

