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Silicon crystallinity control during laser direct microstructuring with bursts of picosecond pulses
Optics Express
|October 19, 2017
Summary
This study demonstrates precise control over laser ablation and modification of silicon using picosecond pulse bursts. This technique enables the fabrication of custom structures with controlled crystallinity, depth, and topography for optical applications.
Area of Science:
- Materials Science
- Laser Physics
- Nanotechnology
Background:
- Laser-based fabrication offers precise material modification.
- Controlling laser-matter interactions is key for advanced manufacturing.
- Silicon's unique properties make it suitable for optical applications.
Purpose of the Study:
- To demonstrate precise control over laser ablation and modification of bulk silicon.
- To achieve homogeneous surface properties with controlled crystallinity, depth, and topography.
- To explore different laser-matter interaction regimes for silicon processing.
Main Methods:
- Utilizing bursts of picosecond laser pulses with a tightly focused beam.
- Employing a custom fiber laser source generating variable pulse bursts (1-20 pulses) at high repetition rates (40 MHz pulse, 83.3 kHz burst).
- Systematically varying pulse energy, pulse positioning, and number of pulses per burst.
Main Results:
- Achieved precise control over surface crystallinity, structure depth, and topography.
- Demonstrated homogeneous surface properties across processed areas.
- Controlled transitions through different laser-matter interaction regimes: no change, amorphization, and ablation with varying amorphization levels.
- Defined single micrometer-sized areas with submicron precision.
Conclusions:
- Picosecond pulse burst laser ablation provides a versatile tool for silicon microstructuring.
- The method allows for controlled fabrication of silicon structures with tailored properties.
- This technique holds promise for advanced applications in optics and photonics.

