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Related Experiment Videos

Spiral scanning X-ray fluorescence computed tomography.

Martin D de Jonge, Andrew M Kingston, Nader Afshar

    Optics Express
    |October 19, 2017
    PubMed
    Summary

    Spiral scanning X-ray fluorescence tomography significantly reduces measurement times. This study introduces an enhanced Fourier ring correlation method for precise resolution diagnostics in computed tomography, improving metal distribution analysis.

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    Area of Science:

    • Materials Science
    • Physics
    • Analytical Chemistry

    Background:

    • X-ray fluorescence tomography (XFT) is crucial for analyzing elemental distributions in small systems.
    • Traditional XFT methods faced limitations due to extensive measurement times.
    • Advancements in synchrotron light sources suggest novel scanning strategies to overcome these limitations.

    Purpose of the Study:

    • To demonstrate the feasibility and benefits of a spiral scanning measurement scheme in XFT.
    • To investigate and identify sources of resolution degradation in spiral-scanning XFT.
    • To enhance diagnostic capabilities for computed tomography (CT) resolution.

    Main Methods:

    • Implementation and execution of a spiral scanning measurement protocol for XFT.

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  • Application of Fourier ring correlation (FRC) analysis to sinogram data.
  • Development of an extended FRC formalism for direct resolution determination from sinograms.

    • Main Results:

    • Successful demonstration of spiral scanning in XFT, minimizing motion overheads.
    • Identification of key factors contributing to resolution degradation using FRC.
    • Validation of the extended FRC method for accurate, direct resolution assessment in CT.

    Conclusions:

    • Spiral scanning XFT is a practical and efficient approach for elemental distribution analysis.
    • The enhanced FRC formalism provides a powerful diagnostic tool for CT resolution.
    • This work advances the capabilities of XFT, particularly with future synchrotron light sources.