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Optimal modified lateral shearing interferometer for submicro-defects measurement of transparent objects.

Kwang-Beom Seo, Seung-Ho Shin

    Applied Optics
    |October 20, 2017
    PubMed
    Summary

    Detecting submicron defects in transparent optical components is challenging. Digital holographic microscopy with a modified lateral shearing interferometer offers a solution for precise defect measurement in plastic injection molded parts.

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    Area of Science:

    • Optics and Photonics
    • Materials Science
    • Metrology

    Background:

    • Plastic injection molding is crucial for high-precision transparent optical components.
    • Cooling rate and pressure variations during molding can introduce submicron inner defects.
    • Submicron defects, particularly those caused by refractive index errors, are difficult to detect with conventional methods.

    Purpose of the Study:

    • To propose a novel method for detecting submicron inner defects in transparent optical components.
    • To develop a digital holographic microscopy technique utilizing an optimal modified lateral shearing interferometer.
    • To enable accurate measurement of submicron defects in challenging materials like defective microlenses.

    Main Methods:

    • Implementation of a modified lateral shearing interferometer for digital holographic microscopy.
    • Optimization of the lateral shearing distance to eliminate duplicate images effectively.
    • Application of the developed technique to transparent optical components, including a test microlens.

    Main Results:

    • The proposed digital holographic microscopy method successfully detected submicron defects.
    • The optimized lateral shearing distance proved effective in removing image duplication.
    • Experimental validation with a test microlens confirmed the method's feasibility and accuracy.

    Conclusions:

    • The digital holographic microscopy based on an optimal modified lateral shearing interferometer is a feasible and effective technique for submicron defect detection.
    • This method addresses the limitations of current techniques in identifying minute defects in transparent optical components.
    • The findings contribute to improving the quality control and performance of precision optical elements manufactured via plastic injection molding.