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Related Experiment Video

Updated: Feb 20, 2026

High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques

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Dual-sensitivity profilometry with defocused projection of binary fringes.

G Garnica, M Padilla, M Servin

|October 20, 2017

Summary

This study introduces a dual-sensitivity profilometry method using defocused binary fringes. It enables accurate 3D surface measurements on discontinuous surfaces by combining high- and low-frequency fringe data.

Area of Science:

Optical Metrology
3D Surface Profilometry
Image Processing

Background:

Traditional profilometry techniques often require complex calibration and struggle with discontinuous surfaces.
Projector defocusing is a method to generate sinusoidal fringes from binary patterns, but its application in dual-sensitivity profilometry needs optimization.
Nonlinear gamma calibration of projectors can be cumbersome and introduce errors.

Purpose of the Study:

To present a dual-sensitivity profilometry technique using defocused projection of binary fringes.
To enable accurate 3D surface reconstruction of discontinuous surfaces.
To simplify the fringe generation process by eliminating the need for projector gamma calibration.

Main Methods:

Generating two sets of sinusoidal fringe patterns (high- and low-frequency) by applying a single analog low-pass filter (projector defocusing) to binary fringes.

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Utilizing high-frequency fringes for high-quality wrapped phase maps and low-frequency fringes for nonwrapped phase maps.

Employing error-diffusion dithering for low-frequency binary fringe generation.

Main Results:

Achieved high-quality wrapped phase maps using high-frequency carrier fringes.
Obtained lower-quality, nonwrapped phase maps with low-frequency carrier fringes.
Demonstrated the utility of the nonwrapped phase map as a stepping stone for dual-sensitivity temporal phase unwrapping.

Conclusions:

The proposed dual-sensitivity profilometry technique effectively measures discontinuous surfaces.
A single defocusing level allows for faster acquisition of both high- and low-frequency fringe data.
The binary nature of fringes eliminates the need for projector gamma calibration, simplifying the process.