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Updated: Feb 20, 2026

Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures

Published on: December 5, 2015

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Atomistic Explanation for Interlayer Charge Transfer in Metal-Semiconductor Nanocomposites: The Case of Silver and

Giovanni Di Liberto1, Valentina Pifferi1, Leonardo Lo Presti1,2,3

  • 1Dipartimento di Chimica, Università degli Studi di Milano , Via Golgi 19, I-20133 Milano, Italy.

The Journal of Physical Chemistry Letters
|October 20, 2017
PubMed

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