Metal-Semiconductor Junctions
Fermi Level Dynamics
Semiconductors
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Electrical Conductivity
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Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Sebastian Hietzschold1,2,3, Sabina Hillebrandt1,3, Florian Ullrich1,4
1InnovationLab , Speyerer Str. 4, 69115 Heidelberg, Germany.
Functionalizing nickel oxide (NiO) surfaces with self-assembled monolayers (SAMs) can tune work functions. However, efficient charge extraction in organic solar cells requires high NiO conductivity, not just work function matching.
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