PID Controller
Atomic Force Microscopy
Time-Domain Interpretation of PD Control
Time and frequency -Domain Interpretation of PI Control
PI Controller: Design
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Hui Liu1, Yingzi Li1, Yingxu Zhang2
1School of Physics and Nuclear Energy Engineering, Beihang University,Xueyuan Road No.37, Haidian District, Beijing, 100191, China; Key Laboratory of Micro-nano Measurement-manipulation and Physics (Ministry of Education), Beihang University, Xueyuan Road No.37, Haidian District, Beijing, 100191, China.
This study introduces an intelligent method using iterative learning control to automatically tune Proportional-Integral-Derivative (PID) parameters for atomic force microscopy (AFM). The approach optimizes PID tuning for accurate sample topography imaging without manual intervention.
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