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The effect of self-consistent potentials on EXAFS analysis

B Ravel1, M Newville2, J J Kas3

  • 1National Institute of Standards and Technology, Gaithersburg, MD 20899, USA.

Journal of Synchrotron Radiation
|November 2, 2017
PubMed

Keywords:
EXAFSdata analysisreal-space multiple scattering

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