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    This study introduces an optical standing-wave interferometer using scattered light detection. The novel method achieves nanometer resolution for precise displacement measurements.

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    Area of Science:

    • Optics
    • Interferometry
    • Metrology

    Background:

    • Optical standing-wave fields are crucial for high-precision measurements.
    • Traditional interferometers face challenges in sensitivity and complexity.
    • Scattered light detection offers an alternative approach for optical field analysis.

    Purpose of the Study:

    • To propose a novel optical standing-wave interferometer.
    • To utilize scattered light for observing optical standing-wave intensity.
    • To develop a phase quadrature detection technique for displacement measurement.

    Main Methods:

    • An ultra-thin scattering plate was inserted into an optical standing-wave field.
    • Scattered light intensity was detected to map the standing-wave field.
    • A phase quadrature detection technique employing two scattering plates was implemented.

    Main Results:

    • The intensity of the optical standing-wave field was successfully observed.
    • The developed technique demonstrated effective displacement measurement.
    • Experimental validation confirmed nanometer-level resolution and micrometer-level range.

    Conclusions:

    • The proposed optical standing-wave interferometer based on scattered light detection is effective.
    • The phase quadrature detection technique enables high-resolution displacement sensing.
    • This method offers a promising approach for advanced metrology applications.