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Updated: Feb 19, 2026

Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source
Published on: April 4, 2017
Bo-Dong Peng1, Yan Song1, Dong-Wei Hei1
1State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi'an 710024, China.
This study introduces a novel interferometric method to measure real-time excess carrier density and refractive index changes in semiconductors exposed to MeV photons. The findings aid in developing radiation-optic systems by detailing carrier dynamics in materials like GaAs and ZnO.
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