Lattice Centering and Coordination Number
X-ray Crystallography
Structures of Solids
Trends in Lattice Energy: Ion Size and Charge
NMR Spectrometers: Resolution and Error Correction
Yield Criteria for Ductile Materials under Plane Stress
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X-ray Powder Diffraction in Conservation Science: Towards Routine Crystal Structure Determination of Corrosion Products on Heritage Art Objects
Published on: June 8, 2016
Masami Tsubota1, Jiro Kitagawa2
1Physonit Inc., 6-10 Minami-horikawa, Kaita, Aki, Hiroshima, 736-0044, Japan. tsubota@physonit.jp.
Accurate lattice parameters require reproducible peak-shift data in Rietveld refinement. This study introduces a new criterion to improve accuracy by distinguishing experimental from analytical peak-shifts, enhancing crystallographic analysis.
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