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Updated: Feb 18, 2026

Electrochemical Etching and Characterization of Sharp Field Emission Points for Electron Impact Ionization
Published on: July 12, 2016
Variation of field enhancement factor near the emitter tip
Debabrata Biswas1, Gaurav Singh1, Shreya G Sarkar1
1Bhabha Atomic Research Centre, Mumbai, 400 085, INDIA and Homi Bhabha National Institute, Mumbai 400 094, INDIA.
Abstract:
The field enhancement factor at the emitter tip and its variation in a close neighbourhood determines the emitter current in a Fowler-Nordheim like formulation. For an axially symmetric emitter with a smooth tip, it is shown that the variation can be accounted by a cosθ˜ factor in appropriately defined normalized co-ordinates. This is shown analytically for a hemiellipsoidal emitter and confirmed numerically for other emitter shapes with locally quadratic tips.
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