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Updated: Feb 18, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
On the electron density localization in elemental cubic ceramic and FCC transition metals by means of a localized
Yosslen Aray1, Ricardo Paredes2, Luis Javier Álvarez3
1Centro de Química, Facultad de Ciencias, Universidad de Ciencias Aplicadas y Ambientales, UDCA, Campus Universitario Norte, Calle 222 No. 55-37, Bogotá, Colombia.
Abstract:
The electron density localization in insulator and semiconductor elemental cubic materials with diamond structure, carbon, silicon, germanium, and tin, and good metallic conductors with face centered cubic structure such as α-Co, Ni, Cu, Rh, Pd, Ag, Ir, Pt, and Au, was studied using a localized electrons detector defined in the local moment representation. Our results clearly show an opposite pattern of the electron density localization for the cubic ceramic and transition metal materials. It was found that, for the elemental ceramic materials, the zone of low electron localization is very small and is mainly localized on the atomic basin edges. On the contrary, for the transition metals, there are low-valued localized electrons detector isocontours defining a zone of highly delocalized electrons that extends throughout the material. We have found that the best conductors are those in which the electron density at this low-value zone is the lowest.
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