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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Daniel Pérez1, Ivana Gasulla1, Lee Crudgington2
1ITEAM Research Institute, Universitat Politècnica de València, Camino de Vera s/n, 46022, Valencia, Spain.
This study highlights a published correction to the article, indicating a need for careful review of scientific findings. Further details are available in the linked HTML version.
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