Mapping piezoelectric response in nanomaterials using a dedicated non-destructive scanning probe technique

Area of Science:

• Materials Science
• Nanotechnology
• Physics

Background:

• Piezoelectricity in nanomaterials is of significant interest due to enhanced or tunable properties.
• Conventional piezo-response force microscopy (PFM) is limited for nanoscale objects due to destructive physical contact.
• Characterizing piezoelectric response in nanowires necessitates advanced, non-damaging techniques.

Purpose of the Study:

• To develop and demonstrate a non-destructive piezo-response force microscopy (ND-PFM) technique.
• To enable robust characterization of piezoelectric properties in various nanomaterials.
• To overcome limitations of conventional PFM for nanoscale objects.

Main Methods:

• Oscillating the atomic force microscope (AFM) tip into "discontinuous" contact during scanning.
• Applying an AC bias between the tip and sample.
• Monitoring localized deformation at the AC frequency to extract piezoelectric response.

Main Results:

• Successfully applied ND-PFM to soft polymeric (poly-l-lactic acid) nanowires.
• Successfully applied ND-PFM to hard ceramic (barium zirconate titanate-barium calcium titanate) nanowires.
• Demonstrated a versatile technique compatible with commercial AFMs.

Conclusions:

• ND-PFM is a viable non-destructive method for characterizing piezoelectric nanomaterials.
• The technique allows correlation of piezoelectric properties with microstructural features.
• ND-PFM overcomes key characterization challenges in the field of nanoscale piezoelectricity.