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Updated: Feb 17, 2026

Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
1Shanghai EBIT Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433, China.
A new flat crystal spectrometer (FCS) was developed to improve upon earlier designs, offering enhanced performance for X-ray measurements. This advanced spectrometer achieves a high resolving power, enabling more precise analysis of spectral lines from various sources.
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