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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic
Published on: August 25, 2016
A high precision flat crystal spectrometer compatible for ultra-high vacuum light source
1Shanghai EBIT Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433, China.
Abstract:
We report on a flat crystal spectrometer (FCS) featuring a differently pumped rotary feedthrough and double detectors connected to a crystal chamber by extendable bellows built at the Shanghai EBIT Laboratory. It was designed to overcome defects such as oil contamination, little distance from the detector to the crystal and others of an early FCS equipped at the same laboratory, but still keeps a large detectable angle range of detectors and brings new features and functions such as the Bond method measurement and double-crystal measurement which are based on the two-detector and large bellow design. This new FCS could cover an energy range of measurable photons from 570 eV to 10 keV and reach a vacuum better than 6 × 10-10 Torr and thus is compatible for coupling directly to ultra-high vacuum light sources. Off-line tests of the FCS were undertaken where Kα x-rays from solid titanium were measured and analyzed. Measurements of transitions in He-like argon ions were performed when the spectrometer was directly connected to Shanghai EBIT, and the width of the x-ray source was monitored simultaneously using an x-ray slit imaging system. An observed spectral line broadening was 0.869 eV corresponding to a resolving power of 3600, including Doppler broadening of the x-ray source. Taking account of the measured source width, we made simulations using the SHADOW 3 code and got a nominal resolving power of 6500 for the spectrometer. This high nominal resolving power is due to a longer distance from the crystal to the detector, comparing with that in the early FCS.
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