Ranking Quantitative Resistance to Septoria tritici Blotch in Elite Wheat Cultivars Using Automated Image Analysis

Petteri Karisto1, Andreas Hund1, Kang Yu1

  • 1First, seventh, and eighth authors: Plant Pathology Group, Institute of Integrative Biology, ETH Zurich, Zurich, Switzerland; second, third, fourth, and fifth authors: Crop Science Group, Institute of Agricultural Sciences, ETH Zurich, Zurich, Switzerland; and sixth author: Crop Breeding and Genetic Resources, Department of Plant Breeding, Agroscope, Nyon, Switzerland.

Phytopathology
|December 7, 2017
PubMed

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